Please use this identifier to cite or link to this item:
http://localhost:8080/xmlui/handle/123456789/39181Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Gunther, Bauer | - |
| dc.date.accessioned | 2025-04-24T14:50:38Z | - |
| dc.date.available | 2025-04-24T14:50:38Z | - |
| dc.date.issued | 1996 | - |
| dc.identifier.isbn | 354059129X | - |
| dc.identifier.uri | https://di.univ-blida.dz/jspui/handle/123456789/39181 | - |
| dc.language.iso | fr | fr_FR |
| dc.publisher | Springer-Verlag | fr_FR |
| dc.subject | Semiconductors | fr_FR |
| dc.subject | optical properties | fr_FR |
| dc.title | Optical characterization of epitaxial:semiconductor layers | fr_FR |
| dc.type | Book | fr_FR |
| Appears in Collections: | Livres | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 2-537-80.pdf | livre | 333,94 kB | Adobe PDF | View/Open |
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