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dc.contributor.authorLepoutre, François-
dc.contributor.authorPlacko, Dominique-
dc.contributor.authorSurrel, Yves-
dc.date.accessioned2024-09-23T10:33:24Z-
dc.date.available2024-09-23T10:33:24Z-
dc.date.issued2003-
dc.identifier.isbn2746202093-
dc.identifier.urihttps://di.univ-blida.dz/jspui/handle/123456789/30303-
dc.description595p. : fig.,tabl. ; 24 cmfr_FR
dc.language.isofrfr_FR
dc.publisherHermés sciences publicationfr_FR
dc.subjectMesure,instrument de : congrèsfr_FR
dc.subjectMicrotechniques : congrèsfr_FR
dc.titleSystémes et microsystémes pour la caractérisationfr_FR
dc.title.alternativeC21 2001fr_FR
dc.typeBookfr_FR
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