Please use this identifier to cite or link to this item:
http://localhost:8080/xmlui/handle/123456789/30720Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Chikawa, G. | - |
| dc.contributor.author | Sumino, K | - |
| dc.contributor.author | Wada, K. | - |
| dc.date.accessioned | 2024-09-30T12:59:30Z | - |
| dc.date.available | 2024-09-30T12:59:30Z | - |
| dc.date.issued | 1987 | - |
| dc.identifier.isbn | 9027723524 | - |
| dc.identifier.uri | https://di.univ-blida.dz/jspui/handle/123456789/30720 | - |
| dc.description | VI-261 p.: fig.; 23 cm | fr_FR |
| dc.language.iso | en | fr_FR |
| dc.publisher | KTK Scientific Publishers | fr_FR |
| dc.subject | Semi conductors : Defects : Congresses | fr_FR |
| dc.title | Defects and properties of semiconductors: defect engineering | fr_FR |
| dc.type | Book | fr_FR |
| Appears in Collections: | Livres | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 2-621-415.pdf | Livre | 260,98 kB | Adobe PDF | View/Open |
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