Please use this identifier to cite or link to this item: http://localhost:8080/xmlui/handle/123456789/32277
Full metadata record
DC FieldValueLanguage
dc.contributor.authorOrton, J. W.-
dc.contributor.authorBlood, P.-
dc.date.accessioned2024-11-03T11:07:49Z-
dc.date.available2024-11-03T11:07:49Z-
dc.date.issued1990-
dc.identifier.isbn0125286252-
dc.identifier.urihttps://di.univ-blida.dz/jspui/handle/123456789/32277-
dc.descriptionXVII - 291 p. ;24 cmfr_FR
dc.language.isoenfr_FR
dc.publisherAcademic Pressfr_FR
dc.relation.ispartofseriesTechniques of physics;-
dc.subjectSemiconductors, Electrical propertiesfr_FR
dc.subjectSemiconductors : Physicsfr_FR
dc.subjectSemiconductors : Electricity and magnetismfr_FR
dc.titleThe Electrical characterization of semiconductorsfr_FR
dc.title.alternativemeasurement of minority carrier propertiesfr_FR
dc.typeBookfr_FR
Appears in Collections:Livres

Files in This Item:
File Description SizeFormat 
2-621-532.pdflivre1,52 MBAdobe PDFView/Open


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.