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Please use this identifier to cite or link to this item: http://localhost:8080/xmlui/handle/123456789/34299
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dc.contributor.authorIda, Nathan-
dc.date.accessioned2024-11-25T08:48:07Z-
dc.date.available2024-11-25T08:48:07Z-
dc.date.issued1992-
dc.identifier.isbn0792320077-
dc.identifier.urihttps://di.univ-blida.dz/jspui/handle/123456789/34299-
dc.descriptionXV-394 p.: fig.,tabl.; 24 cmfr_FR
dc.language.isoenfr_FR
dc.publisherKluwer Academic Publishersfr_FR
dc.relation.ispartofseriesDevelopments in electroma;-
dc.subjectNom-destructive testingfr_FR
dc.subjectMicrowave meaurementsfr_FR
dc.titleMicrowave NDTfr_FR
dc.typeBookfr_FR
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