Systémes et microsystémes pour la caractérisation

dc.contributor.author	Lepoutre, François
dc.contributor.author	Placko, Dominique
dc.contributor.author	Surrel, Yves
dc.date.accessioned	2024-09-23T10:33:24Z
dc.date.available	2024-09-23T10:33:24Z
dc.date.issued	2003
dc.identifier.isbn	2746202093
dc.identifier.uri	https://di.univ-blida.dz/jspui/handle/123456789/30303
dc.description	595p. : fig.,tabl. ; 24 cm	fr_FR
dc.language.iso	fr	fr_FR
dc.publisher	Hermés sciences publication	fr_FR
dc.subject	Mesure,instrument de : congrès	fr_FR
dc.subject	Microtechniques : congrès	fr_FR
dc.title	Systémes et microsystémes pour la caractérisation	fr_FR
dc.title.alternative	C21 2001	fr_FR
dc.type	Book	fr_FR