Afficher la notice abrégée
dc.contributor.author |
Chikawa, G. |
|
dc.contributor.author |
Sumino, K |
|
dc.contributor.author |
Wada, K. |
|
dc.date.accessioned |
2024-09-30T12:59:30Z |
|
dc.date.available |
2024-09-30T12:59:30Z |
|
dc.date.issued |
1987 |
|
dc.identifier.isbn |
9027723524 |
|
dc.identifier.uri |
https://di.univ-blida.dz/jspui/handle/123456789/30720 |
|
dc.description |
VI-261 p.: fig.; 23 cm |
fr_FR |
dc.language.iso |
en |
fr_FR |
dc.publisher |
KTK Scientific Publishers |
fr_FR |
dc.subject |
Semi conductors : Defects : Congresses |
fr_FR |
dc.title |
Defects and properties of semiconductors: defect engineering |
fr_FR |
dc.type |
Book |
fr_FR |
Fichier(s) constituant ce document
Ce document figure dans la(les) collection(s) suivante(s)
Afficher la notice abrégée