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dc.contributor.author |
Ida, Nathan |
|
dc.date.accessioned |
2024-11-25T08:48:07Z |
|
dc.date.available |
2024-11-25T08:48:07Z |
|
dc.date.issued |
1992 |
|
dc.identifier.isbn |
0792320077 |
|
dc.identifier.uri |
https://di.univ-blida.dz/jspui/handle/123456789/34299 |
|
dc.description |
XV-394 p.: fig.,tabl.; 24 cm |
fr_FR |
dc.language.iso |
en |
fr_FR |
dc.publisher |
Kluwer Academic Publishers |
fr_FR |
dc.relation.ispartofseries |
Developments in electroma; |
|
dc.subject |
Nom-destructive testing |
fr_FR |
dc.subject |
Microwave meaurements |
fr_FR |
dc.title |
Microwave NDT |
fr_FR |
dc.type |
Book |
fr_FR |
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