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Transmission electron microscopy and diffractometry of materials
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| dc.contributor.author | Fultz, Brent | |
| dc.contributor.author | Howe, James M | |
| dc.date.accessioned | 2024-12-11T09:49:58Z | |
| dc.date.available | 2024-12-11T09:49:58Z | |
| dc.date.issued | 2002 | |
| dc.identifier.isbn | 3540437649 | |
| dc.identifier.uri | https://di.univ-blida.dz/jspui/handle/123456789/35207 | |
| dc.description | XXI-748 p.: ill.; 25 cm | fr_FR |
| dc.language.iso | en | fr_FR |
| dc.publisher | Springer International Publishing | fr_FR |
| dc.subject | Matériaux : microscopie | fr_FR |
| dc.subject | Microscopie électronique en transmission | fr_FR |
| dc.subject | Diffractomètres de rayons X | fr_FR |
| dc.title | Transmission electron microscopy and diffractometry of materials | fr_FR |
| dc.type | Book | fr_FR |
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