Please use this identifier to cite or link to this item:
http://localhost:8080/xmlui/handle/123456789/35207| Title: | Transmission electron microscopy and diffractometry of materials |
| Authors: | Fultz, Brent Howe, James M |
| Keywords: | Matériaux : microscopie Microscopie électronique en transmission Diffractomètres de rayons X |
| Issue Date: | 2002 |
| Publisher: | Springer International Publishing |
| Description: | XXI-748 p.: ill.; 25 cm |
| URI: | https://di.univ-blida.dz/jspui/handle/123456789/35207 |
| ISBN: | 3540437649 |
| Appears in Collections: | Livres |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 2-530-143.pdf | livre | 2,98 MB | Adobe PDF | View/Open |
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