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Please use this identifier to cite or link to this item: http://localhost:8080/xmlui/handle/123456789/30303
Title: Systémes et microsystémes pour la caractérisation
Other Titles: C21 2001
Authors: Lepoutre, François
Placko, Dominique
Surrel, Yves
Keywords: Mesure,instrument de : congrès
Microtechniques : congrès
Issue Date: 2003
Publisher: Hermés sciences publication
Description: 595p. : fig.,tabl. ; 24 cm
URI: https://di.univ-blida.dz/jspui/handle/123456789/30303
ISBN: 2746202093
Appears in Collections:Livres

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